There has been significant recent growth in electronic complexity and the amount of embedded software in products, and in many of them there is the potential for software flaws to potentially be life-threatening. The reuse of test components represents one methodology that can help to ensure efficient and complete testing while also saving time and cost. This discussion explains how both National Instruments and the LDRA tool suite can be used to implement test component reuse and how this can benefit development of products for safety critical systems.